Chemical, structural and electrical characterizations in the BIZNVOX family

Citation
C. Vernochet et al., Chemical, structural and electrical characterizations in the BIZNVOX family, J MAT CHEM, 10(12), 2000, pp. 2811-2817
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS CHEMISTRY
ISSN journal
09599428 → ACNP
Volume
10
Issue
12
Year of publication
2000
Pages
2811 - 2817
Database
ISI
SICI code
0959-9428(2000)10:12<2811:CSAECI>2.0.ZU;2-B
Abstract
The BIZNVOX solid solution domain, stable at room temperature, has been det ermined. alpha-, beta- and gamma -type compounds can be stabilized dependin g on the x and y values of the general Bi-2(V1 - x - yZnxBiy)O-z formula. T he alpha- and beta -type phases exhibit incommensurate modulations studied by X-ray powder diffraction. The lock-in of their wave vectors on the three -fold and two-fold superstructures of the undoped alpha- and beta -Bi4V2O11 , respectively, is clearly evidenced. SAEDand HREM observations reveal very complex disorder correlated with the attractive oxide ion conductivity of these materials.