Laser diffraction relaxometer for studying photoexcitation kinetics in condensed media

Authors
Citation
Ev. Ivakin, Laser diffraction relaxometer for studying photoexcitation kinetics in condensed media, J OPT TECH, 67(11), 2000, pp. 951-954
Citations number
11
Categorie Soggetti
Optics & Acoustics
Journal title
JOURNAL OF OPTICAL TECHNOLOGY
ISSN journal
10709762 → ACNP
Volume
67
Issue
11
Year of publication
2000
Pages
951 - 954
Database
ISI
SICI code
1070-9762(200011)67:11<951:LDRFSP>2.0.ZU;2-V
Abstract
This paper describes the operating principle of a device created for the st udy of the relaxation of photoexcited states that do not show up in lumines cence. Examples are given of how it can be used to investigate the physical properties of certain crystals. (C) 2000 The Optical Society of America. [ S1070-9762(00)00711-9].