Particle induced X-ray emission (PIXE) analysis of Basella Alba L leaves

Six groups of Basella Alba L plants grown in different conditions were anal ysed by using particle induced X-ray emission (PIXE) method to establish a relationship between the elemental map and growth fertiliser conditions. Th e target samples were bombarded with a 3 MeV protons beam at the tandem acc elerator of IFIN-HH Bucharest and the X-rays were detected with a HPGe dete ctor with a 160 eV resolution at the 6.4 keV of Ka line of iron. The concen trations obtained have an estimated error of less then 6% for most of the e lements analysed.