New very high frequency plasma source using a TM01-mode patch antenna withshort pins

Citation
T. Okumura et al., New very high frequency plasma source using a TM01-mode patch antenna withshort pins, J VAC SCI A, 18(6), 2000, pp. 2815-2821
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
18
Issue
6
Year of publication
2000
Pages
2815 - 2821
Database
ISI
SICI code
0734-2101(200011/12)18:6<2815:NVHFPS>2.0.ZU;2-R
Abstract
We evaluated the basic characteristics of a new very high frequency (VHF) p lasma source using a TM01-mode patch antenna with short pins. The antenna c omprises a round dielectric plate and a round metal plate which is grounded by short pins isotropically arranged. Electromagnetic field simulation has verified the isotropic distribution of both electric and magnetic fields. Ion-saturated current density measurements (Cl-2 = 100 seem, 1 Pa and VHF p ower = 1000 W) by placing the antenna in a cylindrical etching chamber 450 mm in diameter and 217 mm deep have revealed that uniform plasma is generat ed if a circular slit is positioned properly; that higher ion density is at tained with dielectric plate relative permittivity set at 20, than at 7; an d that increased VHF power causes proportional increase in ion density with out giving rise to mode jumping or hysteresis. Experiment has revealed that the plasma source subject to our study provides superior ignitability, bei ng capable of starting discharge even under 0.1 Pa. Experimental etching of polycrystalline silicon using this plasma source has yielded satisfactory results that etch rate is 183.5 nm/ min+/-3.68%, poly-Si selectivity agains t resist is 4.8, and that against oxide film is 280 in main etching. (C) 20 00 American Vacuum Society. [S0734-2101(00)02006-6].