Thermal stability of electroless-nickel/solder interface: Part B. Interfacial fatigue resistance

Authors
Citation
Pl. Liu et Jk. Shang, Thermal stability of electroless-nickel/solder interface: Part B. Interfacial fatigue resistance, MET MAT T A, 31(11), 2000, pp. 2867-2875
Citations number
46
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science",Metallurgy
Journal title
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE
ISSN journal
10735623 → ACNP
Volume
31
Issue
11
Year of publication
2000
Pages
2867 - 2875
Database
ISI
SICI code
1073-5623(200011)31:11<2867:TSOEIP>2.0.ZU;2-I
Abstract
The relationship between fatigue resistance and interfacial microstructure was studied along the interface between the Sn-Pb eutectic alloy and an ele ctroless Ni-P coating. The fatigue resistance of the solder interface was m easured from the flexural peel fracture mechanics specimens in the as-reflo wed, mild-aged, and overaged conditions. While the mild aging had only a ma rginal effect on the fatigue resistance of the interface, overaging was fou nd to significantly degrade the interfacial resistance to fatigue-crack,gro wth, resulting in a lower fatigue threshold and a much earlier onset of the fast fracture. The effects of the overaging were shown to result from the transformation of the interfacial microstructure, which weakened the crack- sliding resistance in the near-threshold regime and embrittled the interfac e in the high crack-growth rate regime.