We describe a far field optical imaging technique for surface topography me
asurement with subwavelength lateral resolution. In this system, the surfac
e under test is vibrated in a plane parallel to the plane of the surface an
d perpendicular to the incident probe beam. The phase of the reflected beam
, modulated by surface irregularities, is detected by cutting half of the o
verall beam with a knife-edge and by using a lock-in amplifier whereby nois
e floor is lowered and transfer function profile is extended to higher spat
ial frequencies. We present experimental results showing subwavelength late
ral resolution. (C) 2000 Published by Elsevier Science B.V.