Far field optical imaging with subwavelength resolution

Citation
J. Murakowski et al., Far field optical imaging with subwavelength resolution, OPT COMMUN, 185(4-6), 2000, pp. 295-303
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS COMMUNICATIONS
ISSN journal
00304018 → ACNP
Volume
185
Issue
4-6
Year of publication
2000
Pages
295 - 303
Database
ISI
SICI code
0030-4018(20001115)185:4-6<295:FFOIWS>2.0.ZU;2-J
Abstract
We describe a far field optical imaging technique for surface topography me asurement with subwavelength lateral resolution. In this system, the surfac e under test is vibrated in a plane parallel to the plane of the surface an d perpendicular to the incident probe beam. The phase of the reflected beam , modulated by surface irregularities, is detected by cutting half of the o verall beam with a knife-edge and by using a lock-in amplifier whereby nois e floor is lowered and transfer function profile is extended to higher spat ial frequencies. We present experimental results showing subwavelength late ral resolution. (C) 2000 Published by Elsevier Science B.V.