Time adaptive denoising of single trial event-related potentials in the wavelet domain

We present a new wavelet-based method for single trial analysis of transien t and time variant event-related potentials (ERPs). Expecting more accurate filter settings than achieved by other techniques (low-pass filter, a post eriori Wiener filter, time invariant wavelet filter), ERPs were initially b alanced in time. By simulation, better filter performance could be establis hed for test signals contaminated with either white noise or isospectral no ise. To provide an example of real application, the method was applied to l imbic P300 potentials (MTL-P300). As a result, variance of single trial MTL -P300s decreased, without restricting the corresponding mean. The proposed method can be regarded as an alternative for single-trial ERP analysis.