Double fitting of Marker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica (vol 76, pg 3346, 2000)

Authors
Qui, MX Vilaseca, R Botey, M Sellares, J Pi, F Orriols, G
Citation
Mx. Qui et al., Double fitting of Marker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica (vol 76, pg 3346, 2000), APPL PHYS L, 77(23), 2000, pp. 3863-3863
Citations number
1
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
23
Year of publication
2000
Pages
3863 - 3863
Database
ISI
SICI code
0003-6951(200012)77:23<3863:DFOMFT>2.0.ZU;2-8