XPS investigation of X-ray-induced reduction of metal ions

Authors
Suzer, S
Citation
S. Suzer, XPS investigation of X-ray-induced reduction of metal ions, APPL SPECTR, 54(11), 2000, pp. 1716-1718
Citations number
21
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
APPLIED SPECTROSCOPY
ISSN journal
00037028 → ACNP
Volume
54
Issue
11
Year of publication
2000
Pages
1716 - 1718
Database
ISI
SICI code
0003-7028(200011)54:11<1716:XIOXRO>2.0.ZU;2-W