A photoelectric method for analyzing NO-Induced apoptosis in cultured neuronal cells

A photoelectric method for analyzing NO-induced apoptosis in cultured neuro nal cells is presented. By integrating ITO (a transparent electrode of indi um-tin oxide coated with borosilicate) with a layer of primary rat cerebell ar granule cells and a photoelectric-current-measuring system, a cylosensor for measuring photoelectric current of neuronal cells was formed. The cell s generated an anode photo-electric current under white light (200-800 nm). The amplitude of the photoelectric current was related to the cell number, the light intensity and the cell viability. During neuronal apoptosis, the decrease of the photoelectric current wits in accordance with the decrease of the cell viability, the loss of mitochondrial transmembrane potential, and the fragmentation of DNA. This photoelectric method may provide a simpl e and sensitive way to study electron-transfer mechanism during NO-induced neuronal apoptosis.