In this work, we investigated both experimentally and numerically the impac
t of macroscopic oxide thickness uniformity on Weibull breakdown characteri
stics for both Weibull parameters, namely, the characteristic times and Wei
bull slopes over a wide range of oxide thicknesses. We report the abnormal
characteristics of the Weibull time-to-breakdown distributions and non-Pois
son area scaling behavior observed on ultrathin oxides. Two numerical metho
ds using the parameters obtained from two independent sets of experimental
results are developed to quantitatively explain these effects in the contex
t of current modulation due to oxide thickness variation. The relationship
between time-to-breakdown and charge-to-breakdown distributions has been cl
arified and established. It is found that without proper treatment of these
effects, the use of Weibull slopes at higher failure percentiles can lead
to erroneous and pessimistic reliability projection. Furthermore, we perfor
m a detailed full-scale Monte Carlo analysis to evaluate the impact of thic
kness variation on low-percentile breakdown distributions and their sensiti
vity to the thickness dependence of the times-to-breakdown and Weibull slop
es.