Analysis of the depletion layer of exponentially graded P-N junctions withnonuniformly doped substrates

Authors
Citation
N. Rinaldi, Analysis of the depletion layer of exponentially graded P-N junctions withnonuniformly doped substrates, IEEE DEVICE, 47(12), 2000, pp. 2340-2346
Citations number
23
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
47
Issue
12
Year of publication
2000
Pages
2340 - 2346
Database
ISI
SICI code
0018-9383(200012)47:12<2340:AOTDLO>2.0.ZU;2-F
Abstract
A detailed analysis of the depletion layer of exponentially graded p-n junc tions is presented, which improves previous efforts in this field in differ ent aspects. 1) We obtain analytical expressions for the depletion layer wi dths which are nearly as simple as those given by the widely used step and linearly graded junction models, but by far more accurate. In addition, we derive simple closed-form expressions for the punch;through and reach-throu gh voltages. 2) The analysis is extended to the case of substrates with non uniform doping profile, a case rarely treated in the literature, but of gre at importance for the design of many devices.