N. Rinaldi, Analysis of the depletion layer of exponentially graded P-N junctions withnonuniformly doped substrates, IEEE DEVICE, 47(12), 2000, pp. 2340-2346
A detailed analysis of the depletion layer of exponentially graded p-n junc
tions is presented, which improves previous efforts in this field in differ
ent aspects. 1) We obtain analytical expressions for the depletion layer wi
dths which are nearly as simple as those given by the widely used step and
linearly graded junction models, but by far more accurate. In addition, we
derive simple closed-form expressions for the punch;through and reach-throu
gh voltages. 2) The analysis is extended to the case of substrates with non
uniform doping profile, a case rarely treated in the literature, but of gre
at importance for the design of many devices.