The Be-enhanced formation of CdSe quantum dots in CdSe/ZnSe heterostructure
s grown by migration enhanced epitaxy on (001)GaAs substrates has been inve
stigated using photoluminescence spectroscopy, x-ray techniques (diffractio
n and reflectometry), and transmission electron microscopy. Coverage of the
ZnSe starting surface with a fractional monolayer of beryllium selenide le
ads to enhanced island formation well below the CdSe thickness of 0.6 monol
ayer corresponding to the onset of the CdSe-rich island formation in the Be
-free structures. The effect of the fractional Be coverage is demonstrated
by observation of sharp lines in the photoluminescence signal from patterne
d mesas with dimensions down to 60 nm, which is due to the emission from in
dividual exciton localization sites attributed to quantum dots. X-ray diffr
action and reflectometry measurements on CdSe/ZnSe short-period superlattic
es with the submonolayer CdSe insertions confirm an enhanced roughening of
the CdSe layer morphology in the case of beryllium coverage. Cross-sectiona
l transmission electron microscopy on the SLs with BeSe fractional monolaye
r exhibits Cd-induced stress modulation along the CdSe sheets with a latera
l scale of similar to4 nm, that can also be interpreted in favor of the BeS
e-nucleated CdSe-based quantum dots. (C) 2000 American Institute of Physics
. [S0021-8979(00)09101-0].