Raman spectroscopy of sol-gel ultrathin films enhanced by surface plasmon polaritons

Citation
A. Brioude et al., Raman spectroscopy of sol-gel ultrathin films enhanced by surface plasmon polaritons, J APPL PHYS, 88(11), 2000, pp. 6187-6191
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
88
Issue
11
Year of publication
2000
Pages
6187 - 6191
Database
ISI
SICI code
0021-8979(200012)88:11<6187:RSOSUF>2.0.ZU;2-D
Abstract
We present experimental results of a Kretschmann-prism coupler method used in Raman scattering experiments with ultrathin (few nanometers) TiO2 sol-ge l films deposited on a metallic silver layer characterized by surface plasm on resonance (SPR) experiments. In this article, we describe a new optical device as an application of SPR properties and coupled with a micro-Raman s cattering setup. The enhancement factor (150) of the Raman intensity in com parison to the classical way allows us to determine the critical thin films structure. Optical results are then discussed and compared to transmission electron microscopy. (C) 2000 American Institute of Physics. [S0021-8979(0 0)07619-2].