We present experimental results of a Kretschmann-prism coupler method used
in Raman scattering experiments with ultrathin (few nanometers) TiO2 sol-ge
l films deposited on a metallic silver layer characterized by surface plasm
on resonance (SPR) experiments. In this article, we describe a new optical
device as an application of SPR properties and coupled with a micro-Raman s
cattering setup. The enhancement factor (150) of the Raman intensity in com
parison to the classical way allows us to determine the critical thin films
structure. Optical results are then discussed and compared to transmission
electron microscopy. (C) 2000 American Institute of Physics. [S0021-8979(0
0)07619-2].