Self-normalized photothermal techniques for thermal diffusivity measurements

Citation
Ja. Balderas-lopez et A. Mandelis, Self-normalized photothermal techniques for thermal diffusivity measurements, J APPL PHYS, 88(11), 2000, pp. 6815-6820
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
88
Issue
11
Year of publication
2000
Pages
6815 - 6820
Database
ISI
SICI code
0021-8979(200012)88:11<6815:SPTFTD>2.0.ZU;2-4
Abstract
Two self-normalized photothermal techniques, to carry out thermal diffusivi ty measurements of condensed phase materials, are presented. These simple m ethodologies involve linear fitting procedures of the signal amplitude and phase. 'These procedures lead to the elimination of the usual requirement f or instrumental transfer-function normalization. The thermal diffusivities for two dental resins and two pure liquids are measured with these simple m ethodologies and very good agreement is found with values reported in the l iterature, where more involved analysis is usually required. (C) 2000 Ameri can Institute of Physics. [S0021-8979(00)08124-X].