Temperature-induced frequency shift of the Raman-active CuO2 planar oxygenvibrational modes of Bi-2212 related to a change of the Cu-O bonding

Citation
C. Boulesteix et al., Temperature-induced frequency shift of the Raman-active CuO2 planar oxygenvibrational modes of Bi-2212 related to a change of the Cu-O bonding, J PHYS-COND, 12(46), 2000, pp. 9637-9643
Citations number
27
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS-CONDENSED MATTER
ISSN journal
09538984 → ACNP
Volume
12
Issue
46
Year of publication
2000
Pages
9637 - 9643
Database
ISI
SICI code
0953-8984(20001120)12:46<9637:TFSOTR>2.0.ZU;2-0
Abstract
A change, with temperature, of the Cu-O or Bi-O bondings was previously sug gested because irregular variations, with temperature, of the lattice param eters and of the electrical resistivity were observed in Bi-2212 crystals. To check the validity of this hypothesis, a study of the variation, with te mperature, of the positions of Raman peaks associated with vibrations of th e different kinds of O atom has been performed at room and at low temperatu re. It is shown here that the 285 cm(-1) Raman peak (B-1g), associated with the out-of-plane vibrations of O atoms of the CuO2 plane, is shifted by +2 % upon decreasing from 294 K to 96 K while the 466 and 627 cm(-1) peaks (bo th A(1g)) associated with the other O atoms are not shifted. So Raman spect roscopy confirms a possible change of the Cu-O bonding, in the CuO2 plane, with temperature, while the Bi-O bonding appears to be unchanged. A hardeni ng of the Cu-O bond is observed at low temperature.