High-resolution imaging X-ray spectrometers

Authors
Citation
L. Struder, High-resolution imaging X-ray spectrometers, NUCL INST A, 454(1), 2000, pp. 73-113
Citations number
81
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
454
Issue
1
Year of publication
2000
Pages
73 - 113
Database
ISI
SICI code
0168-9002(20001101)454:1<73:HIXS>2.0.ZU;2-5
Abstract
The successful commissioning of the XMM-Newton focal plane detectors, radia tion hard X-ray imaging spectroscopic CCDs, has attracted some attention: R eliably operating X-ray CCDs are delivering extraordinary images, recorded in a single-photon counting mode, imaged through the largest X-ray telescop e ever built. The experimental boundary conditions from space applications will serve as a setting to confine the scope of this review. Of course, rel ated applications in other fields of basic and applied science will also be treated. State of the art X-ray detectors with energy, position and time r esolution at high quantum efficiency from the near-infrared up to 20 keV ar e described in detail: todays most advanced systems comprise charge coupled devices and active pixel sensors as well as pixellized silicon drift detec tors. They have been developed for astrophysics experiments in space, for m aterial analysis and for experiments at synchrotron radiation facilities. T he functional principles of the silicon devices are derived from basic soli d-state device physics. The spatial resolution, the spectroscopic performan ce of the systems, the long-term stability and the limitations of the detec tors are described in detail. Field applications show the unique usefullnes s of silicon radiation detectors. (C) 2000 Elsevier Science B.V. All rights reserved.