Reflection spectroscopy is used to obtain the refractive index of Zn1-xMgxS
e layers for the series of alloy composition x, at energies below the energ
y gap of these semiconductors. It is shown that the linear refractive indic
es decrease with Mg content. The two-photon absorption coefficient (beta) w
as obtained from the nonlinear transmission. A relatively strong nonlinear
absorption, which increases with an increase of Mg composition, is observed
. Maximal value of the TPA coefficient is obtained for the Mg content about
40%. The technological figure of merit parameter Im(chi ([3]))/alpha shows
evident maximum for Mg content at 7%. (C) 2000 Elsevier Science B.V. All r
ights reserved.