The anisotropic magnetoresistance (AMR) has been measured for Ni80Fe20
thin films, with the magnetization vector rotating in the film plane
as well as out of the film plane. The out-of-plane (OF) AMR is found t
o be considerably larger than the in-plane (IF) effect, and strongly d
ependent on the degree of texture. In untextured films, the difference
between the IP- and the OP-AMR is explained in terms of a dimensional
ity effect, whereas in (111)-textured films an additional contribution
to the OP-AMR is found.