Surface characterization by a DSPI polarization technique

Authors
Henao, R Torroba, R
Citation
R. Henao et R. Torroba, Surface characterization by a DSPI polarization technique, OPTIK, 111(10), 2000, pp. 468-470
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTIK
ISSN journal
00304026 → ACNP
Volume
111
Issue
10
Year of publication
2000
Pages
468 - 470
Database
ISI
SICI code
0030-4026(2000)111:10<468:SCBADP>2.0.ZU;2-N
Abstract
The use of polarization sensitivity Digital Speckle Pattern Interferometry (DSPI) technique as a new alternative to characterize surface behavior is p roposed. The method is based on the visibility fringes dependence on the wa y each surface depolarizes the incident laser light.