Polariton-polariton scattering in semiconductor microcavities: Distinctivefeatures and similarities to the three-dimensional case

Citation
Ai. Tartakovskii et al., Polariton-polariton scattering in semiconductor microcavities: Distinctivefeatures and similarities to the three-dimensional case, PHYS REV B, 62(20), 2000, pp. R13298-R13301
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
62
Issue
20
Year of publication
2000
Pages
R13298 - R13301
Database
ISI
SICI code
0163-1829(20001115)62:20<R13298:PSISMD>2.0.ZU;2-J
Abstract
Polariton-polariton scattering has been measured in a GaAs-based microcavit y by a c.w. polarized photoluminescence technique using circularly and elli ptically polarized resonant excitation into the lower polariton (LP) branch . The scattering has been found to be strongly enhanced when the singlet bi exciton state is allowed as an intermediate one, i.e., under elliptically p olarized excitation. An exponential growth of k = 0 LP emission has been ac hieved at high excitation densities for the major spin population leading t o the emission polarization degree higher than that of the excitation. The effect indicates the scattering stimulation appearing due to the bosonic na ture of polaritons when the high filling of k = 0 LP states is reached.