Nanoparticle ejection from Au induced by single Xe ion impacts

In situ transmission electron microscopy has been used to observe sputtered Au during Xe ion irradiation in transmission geometry. The sputtered Au wa s collected on an electron transparent carbon foil. Nanoparticles were obse rved on the collector foil after they were ejected by single ion impacts. T he ejection is from the melt zone formed during the thermal spike phase of a displacement cascade produced near the surface by a single ion impact. Su ch single ion impacts are also capable of producing craters. Ejected nanopa rticles can make a significant contribution to sputtering.