Efficient, high-throughput post-STI CMP cleaning

Citation
A. Black et al., Efficient, high-throughput post-STI CMP cleaning, SOL ST TECH, 43(12), 2000, pp. 96
Citations number
6
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
SOLID STATE TECHNOLOGY
ISSN journal
0038111X → ACNP
Volume
43
Issue
12
Year of publication
2000
Database
ISI
SICI code
0038-111X(200012)43:12<96:EHPCC>2.0.ZU;2-0
Abstract
A new high-productivity scrubber system provides precise cotrol of chemical mixing and delivery. It enables using a single cleaning solution for the r emoval of all types of chemical mechanical polishing defects, Philips Semic onductor has successfully applied this system in production for post-STI MP cleaning. The new process removes slurry minimizes etch enlargement of STI CMP microscratches, and significantly higher throughput and lower cost of ownership to conventional scrubber systems.