Lift-off phenomenon in wave soldering

Citation
K. Suganuma et al., Lift-off phenomenon in wave soldering, ACT MATER, 48(18-19), 2000, pp. 4475-4481
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
ACTA MATERIALIA
ISSN journal
13596454 → ACNP
Volume
48
Issue
18-19
Year of publication
2000
Pages
4475 - 4481
Database
ISI
SICI code
1359-6454(200012)48:18-19<4475:LPIWS>2.0.ZU;2-Q
Abstract
The mechanism of lift-off, which is the serious defect formation that the s older fillet is peeled off from a Cu land pad on a printed wiring board in wave soldering, has been examined primarily by using basic Sn-Bi alloys (Sn at 2-5 wt%) and solidification simulation. The probability of lift-off inc reases with increasing Bi content. Lift-off results from the segregation of Bi, which diffuses in a short distance, in the interfacial region between a Sn-Bi alloy and a Cu land pad during dendritic structure formation. A hig her fillet results in a more severe lift-off-the top side of a printed wiri ng board, where the fillet is low, seldom shows lift-off. The solidificatio n simulation indicates that the solidification of the solder fillet rapidly propagates from a lead wire to a fillet edge. A Cu land acts as a heat sin k, with heat flowing from the inner through-hole to the land pad. Both rapi d cooling and annealing at high temperature can effectively prevent lift-of f. (C) 2000 Acta Metallurgica Inc. Published by Elsevier Science Ltd. All r ights reserved.