X-ray and optical characterization of multilayer AlGaAs waveguides

Authors
Leo, G Caldarella, C Masini, G De Rossi, A Assanto, G Durand, O Calligaro, M Marcadet, X Berger, V
Citation
G. Leo et al., X-ray and optical characterization of multilayer AlGaAs waveguides, APPL PHYS L, 77(24), 2000, pp. 3884-3886
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
24
Year of publication
2000
Pages
3884 - 3886
Database
ISI
SICI code
0003-6951(200012)77:24<3884:XAOCOM>2.0.ZU;2-Z
Abstract
Effective-index measurements in multilayer AlGaAs waveguides are used in co njunction with x-ray reflectometry to yield refractive indices and thicknes ses of the constituent layers, with the accuracy required by parametric int eractions in guided-wave and photonic-band-gap structures. (C) 2000 America n Institute of Physics. [S0003-6951(00)03650-0].