Effective-index measurements in multilayer AlGaAs waveguides are used in co
njunction with x-ray reflectometry to yield refractive indices and thicknes
ses of the constituent layers, with the accuracy required by parametric int
eractions in guided-wave and photonic-band-gap structures. (C) 2000 America
n Institute of Physics. [S0003-6951(00)03650-0].