Quantized tunneling current in the metallic nanogaps formed by electrodeposition and etching

Citation
Cz. Li et al., Quantized tunneling current in the metallic nanogaps formed by electrodeposition and etching, APPL PHYS L, 77(24), 2000, pp. 3995-3997
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
24
Year of publication
2000
Pages
3995 - 3997
Database
ISI
SICI code
0003-6951(200012)77:24<3995:QTCITM>2.0.ZU;2-6
Abstract
We have studied electron tunneling across the gap between two electrodes as the gap is varied by electrodeposition and etching. The tunneling current tends to change in a stepwise fashion, corresponding to a discrete change o f the gap width. The stepwise change is due to the discrete nature of atoms and a series of structural relaxations of the atoms at the electrodes betw een stable configurations upon deposition and etching. By stabilizing the t unneling current on various steps using a feedback loop, we have demonstrat ed that stable molecular-scale gaps can be fabricated with subangstrom prec ision. (C) 2000 American Institute of Physics. [S0003-6951(00)00651-3].