Experimental imaging diagnosis of superconducting tunnel junction x-ray detectors by low-temperature scanning synchrotron microscope

Citation
H. Pressler et al., Experimental imaging diagnosis of superconducting tunnel junction x-ray detectors by low-temperature scanning synchrotron microscope, APPL PHYS L, 77(24), 2000, pp. 4055-4057
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
24
Year of publication
2000
Pages
4055 - 4057
Database
ISI
SICI code
0003-6951(200012)77:24<4055:EIDOST>2.0.ZU;2-U
Abstract
Imaging diagnosis of superconducting tunnel junction x-ray detectors has be en performed by an apparatus called the low-temperature scanning synchrotro n microscope (LTSSM) using an x-ray microbeam with a diameter of 5-10 mum o riginated from synchrotron radiation. Quasiparallel intense synchrotron rad iation enables one to obtain the full two-dimensional images of junctions w ith dimensions of 200x200 mum(2) in about 1 h. The LTSSM results indicate t hat the standard quasiparticle diffusion and edge loss model for the spatia l distribution of the junction response to x rays is evidently inadequate f or intermediate or large junctions (with respect to a Josephson penetration depth). On this basis, it is argued that the models proposed for the signa l creation and loss mechanism should be reconsidered. (C) 2000 American Ins titute of Physics. [S0003-6951(00)01650-8].