H. Pressler et al., Experimental imaging diagnosis of superconducting tunnel junction x-ray detectors by low-temperature scanning synchrotron microscope, APPL PHYS L, 77(24), 2000, pp. 4055-4057
Imaging diagnosis of superconducting tunnel junction x-ray detectors has be
en performed by an apparatus called the low-temperature scanning synchrotro
n microscope (LTSSM) using an x-ray microbeam with a diameter of 5-10 mum o
riginated from synchrotron radiation. Quasiparallel intense synchrotron rad
iation enables one to obtain the full two-dimensional images of junctions w
ith dimensions of 200x200 mum(2) in about 1 h. The LTSSM results indicate t
hat the standard quasiparticle diffusion and edge loss model for the spatia
l distribution of the junction response to x rays is evidently inadequate f
or intermediate or large junctions (with respect to a Josephson penetration
depth). On this basis, it is argued that the models proposed for the signa
l creation and loss mechanism should be reconsidered. (C) 2000 American Ins
titute of Physics. [S0003-6951(00)01650-8].