X-ray refractive planar lens with minimized absorption

Citation
V. Aristov et al., X-ray refractive planar lens with minimized absorption, APPL PHYS L, 77(24), 2000, pp. 4058-4060
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
24
Year of publication
2000
Pages
4058 - 4060
Database
ISI
SICI code
0003-6951(200012)77:24<4058:XRPLWM>2.0.ZU;2-W
Abstract
Silicon refractive planar parabolic lenses with minimized absorption were f abricated by a combination of photolithography and dry-etching techniques. Focusing and spectral properties of the lenses were studied with synchrotro n radiation in the energy range 8-25 keV at the European Synchrotron Radiat ion Facility. A focal spot of 1.8 mum with a gain of 18.5 and transmission of more then 80% was measured at 15.6 keV. The spectral characteristics wer e analyzed taking into account material dispersion and photon-energy attenu ation in the hard x-ray range. (C) 2000 American Institute of Physics. [S00 03-6951(00)00151-0].