Silicon refractive planar parabolic lenses with minimized absorption were f
abricated by a combination of photolithography and dry-etching techniques.
Focusing and spectral properties of the lenses were studied with synchrotro
n radiation in the energy range 8-25 keV at the European Synchrotron Radiat
ion Facility. A focal spot of 1.8 mum with a gain of 18.5 and transmission
of more then 80% was measured at 15.6 keV. The spectral characteristics wer
e analyzed taking into account material dispersion and photon-energy attenu
ation in the hard x-ray range. (C) 2000 American Institute of Physics. [S00
03-6951(00)00151-0].