TEMPERATURE RESOLVED X-RAY-DIFFRACTION AS A TOOL OF THERMAL-ANALYSIS

Citation
W. Engel et al., TEMPERATURE RESOLVED X-RAY-DIFFRACTION AS A TOOL OF THERMAL-ANALYSIS, Journal of thermal analysis, 49(2), 1997, pp. 1025-1037
Citations number
28
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
03684466
Volume
49
Issue
2
Year of publication
1997
Pages
1025 - 1037
Database
ISI
SICI code
0368-4466(1997)49:2<1025:TRXAAT>2.0.ZU;2-Y
Abstract
Time and temperature resolved X-ray diffraction was used for thermal a nalysis. Series of diffraction patterns were measured, while the sampl es are heated/cooled stepwise or isothermally with freely selectable t emperature programs. The method was applied for the investigation of t he phase transitions of ammonium nitrate and HMX (1,3,5,7-tetranitro-1 ,3,5,7-tetraaza-cyclooctane), when the identification of phases was re quired. Its capability in the field of kinetics is demonstrated with t he isothermal investigation of the solid state reaction of ammonium ni trate with copper oxide and the non-isothermal investigation of the hi gh temperature corrosion of nickel, which was performed by means of a difference procedure. For obtaining structural details peak fitting an d Rietveld refinement were applied for the investigation of ammonium n itrate and HMX.