Epitaxial growth, characterization, and properties of SiC

Authors
Yoshida, S
Citation
S. Yoshida, Epitaxial growth, characterization, and properties of SiC, ELECTRIC REFRACTORY MATERIALS, 2000, pp. 437-475
Categorie Soggetti
Current Book Contents","Current Book Contents
Journal title
ELECTRIC REFRACTORY MATERIALS → ACNP
Year of publication
2000
Pages
437 - 475
Database
ISI
SICI code