Hydrogen passivated vertical-cavity surface-emitting lasers (VCSELs) h
ave been studied for obtaining low threshold current characteristics.
After hydrogen plasma treatment, threshold currents are significantly
improved compared to air-post type VCSELs due to the passivation of de
fects and the decrease of leakage currents. We also observe the reduct
ion of current injection area by the deactivation of impurity near the
sidewall using moderately high temperature hydrogenation, indicating
that hydrogenation is one of the useful methods for effective device i
solation.