Using inspection data for defect estimation

Authors
Biffl, S
Citation
S. Biffl, Using inspection data for defect estimation, IEEE SOFTW, 17(6), 2000, pp. 36
Citations number
15
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE SOFTWARE
ISSN journal
07407459 → ACNP
Volume
17
Issue
6
Year of publication
2000
Database
ISI
SICI code
0740-7459(200011/12)17:6<36:UIDFDE>2.0.ZU;2-N
Abstract
This article proposes subjective team estimation models calculated from ind ividual estimates and investigates the accuracy of defect estimation models based on inspection data.