The possibility of measurement of local characteristics of semiconductor materials by electron-beam-induced electromotive force technique

Authors
Gostev, AV Rau, EI Zhu, SC Yakimov, EB
Citation
Av. Gostev et al., The possibility of measurement of local characteristics of semiconductor materials by electron-beam-induced electromotive force technique, IAN FIZ, 64(8), 2000, pp. 1568-1573
Citations number
14
Categorie Soggetti
Physics
Journal title
IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA
ISSN journal
03676765 → ACNP
Volume
64
Issue
8
Year of publication
2000
Pages
1568 - 1573
Database
ISI
SICI code
0367-6765(200009)64:8<1568:TPOMOL>2.0.ZU;2-M