Modification of a Nafion (R) ion exchange membrane by a plasma polymerization process

Citation
R. Zeng et al., Modification of a Nafion (R) ion exchange membrane by a plasma polymerization process, J ELEC CHEM, 490(1-2), 2000, pp. 102-106
Citations number
14
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTROANALYTICAL CHEMISTRY
ISSN journal
15726657 → ACNP
Volume
490
Issue
1-2
Year of publication
2000
Pages
102 - 106
Database
ISI
SICI code
Abstract
An ultra-thin anionic exchange layer was deposited on the surface of a Nafi on(R) membrane. This layer was deposited from ethylene and ammonia using a glow-discharge plasma polymerization technique. The scanning electron micro scopy (SEM), Fourier transform infrared attenuated total reflection (FTIR-A TR) spectra and X-ray photoelectron spectroscopy (XPS) showed that the resu lting plasma film containing amine and amide was about 0.5 mum thick. The i on selectivity coefficient for Ht of the plasma modified Nafion(R) membrane was measured and the results showed that a linear Nernst response was exhi bited and the selectivity of proton was enhanced. The resistance of modifie d Nafion was only slightly higher than that of the Nafion(R) membrane. (C) 2000 Elsevier Science S.A. All rights reserved.