Broadband antireflection properties of thin heterogeneous dielectric films

Authors
Shvartsburg, AB Petite, G Hecquet, P
Citation
Ab. Shvartsburg et al., Broadband antireflection properties of thin heterogeneous dielectric films, J OPT SOC A, 17(12), 2000, pp. 2267-2271
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
ISSN journal
10847529 → ACNP
Volume
17
Issue
12
Year of publication
2000
Pages
2267 - 2271
Database
ISI
SICI code
1084-7529(200012)17:12<2267:BAPOTH>2.0.ZU;2-Z
Abstract
New exactly solvable flexible models of inhomogeneous thin film with smooth and deep variations of dielectric susceptibility epsilon (z) are presented . Formation of cutoff frequencies of such films (as well as the broadband a ntireflection), controlled by the profiles epsilon (z), is shown. The cruci al role of gradients of E(z) in the optics of strongly inhomogeneous media is emphasized. (C) 2000 Optical Society of America [S0740-3 232(00)01011-5] OCIS code: 310.6860.