Defects in alpha-Fe induced by intense-pulsed ion beam (IPIB)

Using Rutherford back-scattering (RBS), secondary ion mass spectrometry (SI MS), Auger-electron spectroscopy (AES), transmission electron microscopy (T EM) and scanning electron microscopy (SEM) techniques, formation of differe nt point and linear defects have been found in iron as a result of intense pulsed-ion beam (IPIB) treatment. The close correlation between an average scalar dislocation density with a microhardness magnitude has been proved b oth in near-surface layers and at large depths. The comparable analysis of structure-phase damage after IPIB and intense pulsed-electron beam irradiat ion is interesting for an explanation of different modified properties and an application of such treatments in technologies. (C) 2000 Elsevier Scienc e B.V. All rights reserved.