New approach for the formation and separation of a thin porous silicon layer

Citation
Cs. Solanki et al., New approach for the formation and separation of a thin porous silicon layer, PHYS ST S-A, 182(1), 2000, pp. 97-101
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
182
Issue
1
Year of publication
2000
Pages
97 - 101
Database
ISI
SICI code
0031-8965(200011)182:1<97:NAFTFA>2.0.ZU;2-Z
Abstract
A new one-step method is developed for the formation and separation of a th in porous silicon film (PSF) by electrochemical etching of silicon in hydro fluoric (HF) acid based solution. This provides advantages over the existin g techniques, which are requiring multiple-steps for fabrication and separa tion of a thin layer horn the substrate. The in-situ change in the fluoride ion concentration results in the formation of a high porosity layer beneat h the low porosity layer under the same formation condition, which is confi rmed by detailed morphological analysis. In-situ separation of a thin porou s silicon film from the substrate is obtained by carrying out an anodizatio n for sufficiently long Lime. A two-step approach is also proposed which co nsists of an electrochemical etching followed by an electrochemical polishi ng step and provides a better control over the separation condition than th e one-step approach.