Impurity and topological surface states in porous silicon

Citation
D. Ninno et al., Impurity and topological surface states in porous silicon, PHYS ST S-A, 182(1), 2000, pp. 285-289
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
182
Issue
1
Year of publication
2000
Pages
285 - 289
Database
ISI
SICI code
0031-8965(200011)182:1<285:IATSSI>2.0.ZU;2-M
Abstract
We have developed a method, based on the effective mass approximation, for calculating electronic states in an arbitrarily shaped quantum nanostructnr e. Modelling the average porous silicon nanostructure with a deformed quant um wire, the calculated shallow impur ity binding energies are in good agre ement with surface photovoltage spectroscopy data. We have also studied a n ew type of surface carrier. localization clue to nanostructure: surface geo metrical irregularities. The implications of the existence or these: trappi ng states are discussed for porous silicon.