The new idea to realize contacts through a porous silicon (PS) antireflecti
on coating (ARC) is tested for the first time from the viewpoint of PS elig
ibility towards a rapid high-temperature process. The morphological analysi
s (TEM and SE) reveals that the thickness of PS after the thermal treatment
is slightly increased accompanied by an increase of its porosity. As a res
ult no significant changes in reflectance characteristics are observed. The
refore it can be successfully used as an alternative way for preparation of
PS ARC for silicon solar cells.