Polymer films studied by scanning tunneling microscopy

Authors
Kornilov, VM Lachinov, AN
Citation
Vm. Kornilov et An. Lachinov, Polymer films studied by scanning tunneling microscopy, TECH PHYS L, 26(11), 2000, pp. 952-954
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
TECHNICAL PHYSICS LETTERS
ISSN journal
10637850 → ACNP
Volume
26
Issue
11
Year of publication
2000
Pages
952 - 954
Database
ISI
SICI code
1063-7850(200011)26:11<952:PFSBST>2.0.ZU;2-W
Abstract
Polymer films with thicknesses up to 300 nm were investigated by scanning t unneling microscopy. It was demonstrated that the films contain areas whose images change depending on the scan parameters, which can be explained by the emission processes. (C) 2000 MAIK "Nauka/Interperiodica".