X-ray resonant magnetic scattering: Application to thin films and multilayers

This paper reports on the use of a new technique to investigate the magneti c properties of thin films, multilayers and artificial structures, the X-ra y resonant magnetic scattering at small values of the scattering vector. It can be used either by registering the reflectivity pattern or in a diffrac tion mode. In comparison with magneto-optical Kerr effect or neutron scatte ring, it offers an atomic selectivity due to the resonant excitation of a c ore electron, and even an electronic shell one. Examples are presented main ly in the soft X-range allowing to probe the 3d band of transition metals. They demonstrate the promising possibilities of the method to measure the m agnetic moments carried by each of the atomic components in complex systems , as well as their distribution through thin layers, with an atomic resolut ion.