Surface morphology of ion-beam-irradiated rutile single crystals

Citation
M. Ishimaru et al., Surface morphology of ion-beam-irradiated rutile single crystals, APPL PHYS L, 77(25), 2000, pp. 4151-4153
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
25
Year of publication
2000
Pages
4151 - 4153
Database
ISI
SICI code
0003-6951(200012)77:25<4151:SMOIRS>2.0.ZU;2-F
Abstract
Ion-beam-induced structural changes in rutile (TiO2) have been examined in detail using transmission electron microscopy (TEM). Single crystals of rut ile with (100) orientation were irradiated with 360 keV Xe ions at room tem perature to a fluence of 4x10(15)/cm(2). In addition to a buried damage lay er induced by projectile ions, a damage layer was formed near the surface ( thickness about 10 nm). Nanobeam electron diffraction measurements and high -resolution TEM observations revealed that the surface damage layer consist s of rutile crystallites with different orientations compared to the origin al single crystal. We discuss damage recovery processes in ion irradiated r utile within the context of our results as well as previous observations. ( C) 2000 American Institute of Physics. [S0003-6951(01)01401-2].