A disk designed for compact disk (CD) 2X is employed to test its performanc
e at CD 4X. The eras ability at CD 4X is poorer than that at CD 2X. A sharp
increase in jitter after overwriting for CD 4X was observed as a result of
the existence of two different amorphous mark shapes. One of them is of no
rmal shape and the other is extended with a tail in the trailing part. For
overwriting more than 50 times, only one type of amorphous mark with tiny s
harp tail was observed. This singular amorphous mark shape gives rise to a
decrease in jitter. For much higher overwriting cycles, the jitter will inc
rease with the amount of pinholes present.