Ternary AlInN is grown on (111)GaAs substrates by reactive radio-frequency
magnetron sputtering using aluminum and indium targets in an ambient of arg
on and nitrogen. Highly c-axis-oriented films with a wurtzite structure are
obtained. It is revealed that the composition of AlInN layers can be contr
olled by changing the ratio of the sputtered area of the aluminum plate to
that of the indium plate.