In-beam dielectric properties of alumina at low frequencies

Citation
R. Vila et Er. Hodgson, In-beam dielectric properties of alumina at low frequencies, J NUCL MAT, 283, 2000, pp. 903-906
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
JOURNAL OF NUCLEAR MATERIALS
ISSN journal
00223115 → ACNP
Volume
283
Year of publication
2000
Part
B
Pages
903 - 906
Database
ISI
SICI code
0022-3115(200012)283:<903:IDPOAA>2.0.ZU;2-L
Abstract
Loss tangent data for three commercial alumina grades measured in the range 0.1-300 kHz together with the effect of radiation are presented. Very diff erent dielectric behaviour has been found for the three grades irradiated a t 150 degreesC and 250 degreesC with 1.8 MeV electrons at dose rates of up to 3.5 kGy/s. In the case of Ceraten C9999, an extremely pure alumina, the increase in the loss tangent with dose rate and its dependence on frequency is due to the de radiation induced conductivity (RIC). For Wesgo AL995 and Morgan Matroc Vitox 999 the behaviour is more complex. The influence of an applied electric field has also been examined. The importance of material selection is noted, as is the dose-dependent degradation for Wesgo AL995. ( C) 2000 Elsevier Science B.V. All rights reserved.