Structure of heteroepitaxial thin films of hafnium diboride grown on a Hf(0001) surface as determined by scanning tunneling microscopy

Citation
M. Belyansky et M. Trenary, Structure of heteroepitaxial thin films of hafnium diboride grown on a Hf(0001) surface as determined by scanning tunneling microscopy, J PHYS CH B, 104(50), 2000, pp. 11833-11836
Citations number
23
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF PHYSICAL CHEMISTRY B
ISSN journal
15206106 → ACNP
Volume
104
Issue
50
Year of publication
2000
Pages
11833 - 11836
Database
ISI
SICI code
1520-6106(200012)104:50<11833:SOHTFO>2.0.ZU;2-3
Abstract
Scanning tunneling microscopy has been used to characterize the initial sta ges of epitaxial growth of HfB2 on a Hf(0001) surface. The film was grown o n the substrate at 780 degreesC through chemical vapor deposition using dib orane gas. The growth mechanism appears to combine 2D layer by layer growth with 3D island formation. The HfB2 film first appears as multilayered isla nds on top of large unreacted Hf(0001) terraces with the island edges align ed with the substrate step ledges. For thicker films only hexagonally shape d multilayered HfB2 islands with an average size of 100 Angstrom are seen.