Electron transport coefficients in SF6 and xenon gas mixtures

The electron swarm growth processes in SF6-Xe gas mixtures have been studie d by a pulsed Townsend method over the range 32.24 less than or equal to E/ N less than or equal to 564.2 Td (1 Td = 10(-21) Vm(2)), where E is the ele ctric field and N is the gas density of the mixture. The variation patterns as a function of the density-reduced electric field of the effective ioniz ation coefficient <(<alpha>)over bar>, electron drift velocity Ve and longi tudinal diffusion coefficient D-L in SF6-Xe gas mixtures have been given. T he dielectric strength of SF6-Xe gas mixtures has also been determined, whi ch varies linearly with SF6 concentration in the gas mixtures.