Crosstalk effects in mixed-signal ICs in deep submicron digital CMOS technology

Citation
V. Liberali et al., Crosstalk effects in mixed-signal ICs in deep submicron digital CMOS technology, MICROELEC J, 31(11-12), 2000, pp. 893-904
Citations number
47
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS JOURNAL
ISSN journal
00262692 → ACNP
Volume
31
Issue
11-12
Year of publication
2000
Pages
893 - 904
Database
ISI
SICI code
0026-2692(200011/12)31:11-12<893:CEIMII>2.0.ZU;2-Y
Abstract
This paper illustrates the crosstalk phenomenon and its impact on the desig n of mixed analog/digital circuits with high accuracy specifications. Gener ation of digital disturbs, propagation through the substrate, and effects o n analog devices are considered, with particular emphasis on integrated cir cuits realized on heavily doped substrate, where traditional shielding is l ess effective. Techniques to reduce analog/digital crosstalk are reviewed a nd discussed. A simple modeling approach is presented, suitable for the ana lysis of crosstalk effects using a conventional electrical simulator (SPICE ). Experimental results on a test chip are presented to validate the modeli ng approach. (C) 2000 Elsevier Science Ltd. All rights reserved.