L. Nicolaides et A. Mandelis, Experimental and image-inversion optimization aspects of thermal-wave diffraction tomographic microscopy, OPT EXPRESS, 7(13), 2000, pp. 519-532
Thermal-wave Slice Diffraction Tomography (TSDT) is a photothermal imaging
technique for non-destructive detection of subsurface cross-sectional defec
ts in opaque solids in the very-near-surface region (mm-mm). Conventional r
econstructions of the well-posed propagating wave-field tomographies cannot
be applied to the ill-posed thermal wave problem. Photothermal tomographic
microscopy is used to collect experimental data that are numerically inver
ted with the Tikhonov regularization method to produce thermal diffusivity
cross-sectional images in materials. Multiplicity of solutions, which is in
herent to ill-posed problems, is resolved by adopting the L-curve method fo
r optimization. For tomographic imaging of sub-surface defects, a new high-
resolution radiometric setup is constructed, which reduces the broadening o
f images associated with previous low-resolution setups. (C) 2000 Optical S
ociety of America.