Experimental and image-inversion optimization aspects of thermal-wave diffraction tomographic microscopy

Citation
L. Nicolaides et A. Mandelis, Experimental and image-inversion optimization aspects of thermal-wave diffraction tomographic microscopy, OPT EXPRESS, 7(13), 2000, pp. 519-532
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
OPTICS EXPRESS
ISSN journal
10944087 → ACNP
Volume
7
Issue
13
Year of publication
2000
Pages
519 - 532
Database
ISI
SICI code
1094-4087(200012)7:13<519:EAIOAO>2.0.ZU;2-P
Abstract
Thermal-wave Slice Diffraction Tomography (TSDT) is a photothermal imaging technique for non-destructive detection of subsurface cross-sectional defec ts in opaque solids in the very-near-surface region (mm-mm). Conventional r econstructions of the well-posed propagating wave-field tomographies cannot be applied to the ill-posed thermal wave problem. Photothermal tomographic microscopy is used to collect experimental data that are numerically inver ted with the Tikhonov regularization method to produce thermal diffusivity cross-sectional images in materials. Multiplicity of solutions, which is in herent to ill-posed problems, is resolved by adopting the L-curve method fo r optimization. For tomographic imaging of sub-surface defects, a new high- resolution radiometric setup is constructed, which reduces the broadening o f images associated with previous low-resolution setups. (C) 2000 Optical S ociety of America.