Scanning probe microscopy studies of the substrate annealing effect on Y1Ba2Cu3O7-x thin film growth

Authors
Fan, Y Fitzgerald, AG Storey, BE Tooke, AO
Citation
Y. Fan et al., Scanning probe microscopy studies of the substrate annealing effect on Y1Ba2Cu3O7-x thin film growth, PHYSICA C, 341, 2000, pp. 2339-2340
Citations number
1
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
341
Year of publication
2000
Part
4
Pages
2339 - 2340
Database
ISI
SICI code
0921-4534(200011)341:<2339:SPMSOT>2.0.ZU;2-C
Abstract
The effect of substrate annealing on the growth of Y1Ba2Cu3O7-x (YBCO) thin films has been studied by STM observations of thin films prepared on non-a nnealed and high temperature annealed substrates. Experimental results show that the high density of terrace steps formed on the substrate surface in the high temperature annealing process play a dominant role in governing th e film growth mechanism which determines the surface morphology, microstruc ture and superconducting properties of the film.